Where to go? Predicting next location in IoT environment
Lin, Hao, et al. "Where to go? Predicting next location in IoT environment." Frontiers of Computer Science 15.1 (2020): 1-13.
Lin, Hao, et al. "Where to go? Predicting next location in IoT environment." Frontiers of Computer Science 15.1 (2020): 1-13.
Zhao, Zhiyun, et al. "Matching Neural Network for Extreme Multi-Label Learning." Journal of Physics: Conference Series. Vol. 1642. No. 1. IOP Publishing, 2020.
Talk at UC San Francisco, Department of Testing, San Francisco, California
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley CA, USA
Talk at London School of Testing, London, UK
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA